Electronic & microelectronic test probes:
PCB(FPC)、COF test products :Japan Rika test probe series ︱Japan Nihon denshin test probe series ︱Japan Taisei test probe series︱Japan Sankei probe series ︱Japan Seiken test probe series︱Japan Organ test probe series︱Other test probes, test consumables
SMT、ICT test products:America IDI test probe series ︱America QA test probe series︱America ECT test probe series︱German FM test probe series︱German Ingun test probes series︱German PTR test probes series︱Japan Nihon denshin test probe series ︱Japan Organ test probe series
Semiconductor test probes:Korea LEENO test probe series︱America IDI test probe series︱America QA test probe series︱America ECT test probe series︱German FM test probe series︱Japan Nihon denshin test probe series︱Japan Seiken test probe series
Test probe quality inspection item:
1、Electrical Performance:Contact Resistance Test 2、Mechanical Performance:Durability Test,Spring Force Test,Mechanical Shock,Random Vibration 3、Environmental Testing:Humidity,Salt Spray,Temperature Life,Thermal Shock 4、Others:Drop Test,Solder ability,Side Force.
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